COMPANY PRODUCT

YYF-50KN Slow Strain Rate Stress Corrosion Testing Machine

Product description:

Slow strain rate stress corrosion testing machine Model: YYF-50
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1. Equipment overview

1.1 Name, model and specification

Name: Slow strain rate stress corrosion testing machine Model: YYF-50

Specification: Maximum load 50kN

1.2 Overview of functions

Slow strain rate (SSRT) stress corrosion (SCC) testing machine is used to conduct corrosion tensile tests on materials in corrosive environments, mainly to study the stress corrosion sensitivity of metal materials in corrosive solutions.

The host structure is in the form of a frame, and the loading unit is flexibly installed at the upper or lower end according to the test requirements to adapt to the test requirements of different media environments.

The environmental medium is a solution medium under low temperature and normal pressure. The experimental kettle is generally made of high borosilicate glass, which not only reduces the equipment cost, but also ensures the corrosion resistance to general media.



2. Main technical parameters

No.

ITEM

Parameter

1

Processor(CPU)

DM&P Vortex86DX CPU 800MHz

2

Controller system clock

Max.2.5kHz,16 sensors for 2.5kHz

3

Control and measurement

64-bit processor precise control, 24-bit A/D conversion

4

Selectable system time

400µs,500µs~1000µs

5

PC communication interface

USB 2.0 Full speedorEthernet 100Mbit

6

Data transmission frequency with PC

Max. 1.0kHz

7

External control box/display RS485 interface

Support up to 4 devices

8

Dynamic test frequency

Max.20Hz

9

Encoder input channel

max 32MHz/ 8MHz app. 300kHz

10

Digital input 24V

8pcs

11

Digital output 24V

8pcs

12

Sensor interface

COM1(Built-in)

13

Debug interface

COM2 115kB

14

Synchronous data collection and movement control

Satisfy

15

Bus expansion slot

2pcs

16

All expansion modules

Max.quency 10 kHz

17

Load, deformation or LVDT resolution

±180000 yards

18

Displacement, load and strain control switching

Smooth switching between control modes without impact

19

Realizable dynamic waveform

It can realize the dynamic test of trapezoidal wave, triangle wave and sine wave

20

Drive interface

Analog command: ±10 V; digital command: ±15 bit resolution

21

Load, deformation or LVDT resolution

300mA




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